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New High Speed Multi Purpose X-ray diffractometer Works in "Real Time"

X-ray diffraction has always been a slow technique due mainly to the requirement of scanning mechanical components that are necessary to rotate an X-ray detector from one end of a goniometer to the other as well as to rotate the sample or a heavy X-ray source about the same circle. And to date no one has found a satisfactory solution to this somewhat complex problem.

Now Inel have developed and perfected a remarkable new range of X-ray diffractometers called "Equinox" in which all of the complex mechanical systems normally associated with X-ray diffraction experiments have been eliminated. In there place is a rugged, high resolution curved X-ray detector that can measure all diffraction peaks simultaneously enabling complete measurements to be made in just a few seconds.

The new design is perfect for all types of sample and measurement technique, powder diffraction, thin film analysis, dynamic studies, texture and stress measurements, small and wide angle X-ray diffraction systems in that the curved detector measures the complete diffraction pattern simultaneously and in real time, allowing conventional as well as fast phenomena to be measured. Features include options for high resolution of just 0.04 degrees FWHM with options for micro diffraction allowing measurements to be made on samples as small as 10 microns. A very important feature of the design is that measurement times are reduced to a few seconds rather than the minutes or hours normally associated with conventional XRD instruments.

The first model, EQUINOX 1000, has been designed for bench top use and its performance is truly excellent. Its low cost makes of him an essential instrument to all the laboratories.