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Fall 12 K: Highly precise characterization of materials for nano and bio technologies

pdf Symposium K 401.30 Kb

An increasing effort is currently being directed towards the development of new functionalized nanostructured materials. This symposium expects contributions that demonstrate how highly precise techniques can enable a deep understanding of the materials. This expertise is the key for development of new engineered materials for nano and bio technologies.

Scope:

Currently, an enormous effort is required for the development of new functionalized nanostructured materials including multilayers, nanocomposites, (bio)sensor layers, photonic structures, and a range of other applications. Highly precise, non-destructive characterization techniques are the key to understand and develop these materials, because these methods can be used e.g. for in-situ characterization, they can be integrated in sensors. Due to the required high sensitivity of the characterization of materials properties the techniques are pushed to the limits. In case of optical techniques the major challenges are the extension of the capabilities towards the nano and the photonic range (dimensions much smaller, and dimensions comparable with the optical wavelengths).

The aim of this symposium is both to highlight the capabilities of highly sensitive characterization techniques for the determination of the key structural and material parameters and for a better understanding of the functional properties, as well as to discuss recent progress in the development of functionalized structured materials supported by advanced characterizations. Demonstration of in situ capabilities for a deeper understanding of the structure formation is highly encouraged.

Hot topics to be covered by the symposium:

  • Optical methods (ellipsometry, reflectometry, optical waveguide light-mode spectroscopy, scattering, photoluminescence, etc.)
  • X-ray methods (XRR, XRF, XRD, XPS)
  • Ion beam methods (MEIS, RBS, He microscopy, nuclear reaction analysis, elastic recoil detection analysis)
  • Scanning probe methods
  • Surface modifications
  • Electrochemical and optical biosensors
  • Bio-compatible materials
  • Bio-sensing materials for medical applications
  • Imaging for medical applications

Publication:

Symposium K proceedings: Applied Surface Science, Elsevier

Instructions for manuscript preparation:

Deadline of manuscript submission is October 15, 2012.

Page limits for contributed and invited presentations are 4 and 6, respectively.

The manuscripts should be prepared according to the guidelines of the Applied Surface Science: http://www.elsevier.com/wps/find/journaldescription.cws_home/
505669/authorinstructions


The manuscripts must be submitted using Elsevier's EES system:
http://ees.elsevier.com/apsusc/

As "Article type" choose "EMRS Fall Symp K", so that your manuscript will be processed as part of our symposium – otherwise it will be handled as a regular manuscript.

List of confirmed invited speakers:

  • Hans Arwin (Linköping University, Sweden)
  • Burkhard Beckhoff (PTB, Germany)
  • Octavian Buiu (Lot Oriel, Romania)
  • Fernando Castro (NPL, UK)
  • Amal Chabli (CEA-Grenoble, France)
  • Daniel Franta (Masaryk University, Czech Republik)
  • Gang Jin (Chinese Academy of Sciences, China)
  • Gin Jose (University of Leeds, UK)
  • Birgit Kanngiesser (Technical University Berlin, Germany)
  • Maria Losurdo (IMIP-CNR, Italy)
  • Paul Montgomery (InESS, France)
  • Sebastian Schlücker (University of Osnabrück, Germany)
  • Paul H. Urbach (Delft University of Technology, The Netherlands)
  • Jaap van den Berg (University of Salford, UK)
  • Wolfgang Werner (Vienna University of Technology, Austria)
  • Juan Antonio Zapien (City University of Hong Kong)

Symposium organizers:

Peter Petrik
Research Institute for Technical Physics and Materials Science
Konkoly Thege u. 29-33
H-1121 Budapest
Hungary
Phone: +36 1 392 2502
Fax: +36 1 392 2226
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Andreas Nutsch
ALN
Schottkystrasse 10
91058 Erlangen
Germany
Phone: +49 1607895298
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CeolGi Kim
Chungnam National University
Department of Materials Sci. & Engg.
220 Gung-Dong, Yuesong-Gu
Daejeon-305764
South Korea
Phone: +82-42-821-6632
Fax: +82-42-822-6272
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Jean Pol Vigneron
Facultés Universitaires Notre-Dame de la Paix
University of Namur
Rue de Bruxelles 61
B-5000 Namur
Belgium
Phone: +32 81 72 47 11
Fax: +32 81 72 47 07
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Jeremy Ramsden
Collegium Basilea (Institute of Advanced Study)
Hochstrasse 51
CH-4053 Basel
Switzerland
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Registration desk hours:

Sun 26/05: 13:30 - 19:00
Mon 27/05: 07:30 - 18:00
Tue 28/05: 08:00 - 18:00
Wed 29/05: 08:00 - 18:00
Thu 30/05: 08:00 - 18:00
Fri 31/05: 08:00 - 12:00 

Important deadlines

fall_meeting_picture 
     E-MRS FALL MEETING 13
    DEADLINE FOR ABSTRACT 
              SUBMISSION
             JUNE 10, 2013
 

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