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 Program 2010 Q 351.49 Kb
This symposium aims at providing a forum for researchers interested in applying quantitative methods of electron microscopy and spectroscopy to materials research in the different technology fields, such as electronics, optics, magnetics, energy and environment, engineered materials, nanosystems, soft matter and bioscience. Current topics will be highlighted in keynote presentations given by leading invited experts.
Scope:
Materials research on thin films, bulk materials, surfaces, materials at the nanoscale and at the interface between physical and life sciences is of prevailing interest because of its fundamental importance in understanding the chemical and physical properties of materials and in evaluating their potential for technological applications. With the emergence of new electron optical components for energy filtering and aberration correction and the availability of improved software for data acquisition and analysis, new advanced quantitative high-resolution imaging, diffraction and spectroscopic techniques of electron microscopy have become available. These techniques play a crucial role in characterizing the microstructure and the structure-property relationships of materials, as well as in metrology.
The symposium will address but is not limited to the following topics of interest:
• advanced quantitative electron microscopy (EM) methods – strategies and applications: In-situ EM measurements, electron tomography, scanning-transmission EM, diffractive imaging and diffraction, aberration-corrected EM, electron holography, electron nanospectroscopic techniques for local bonding and elemental mapping, quantitative comparisons (experiment versus theory)
• the application of physical sciences techniques in electron microscopy to soft and biological materials
• metrology for thin layers, nanoscale materials, and interfaces
• electron microscopy for the characterization of the growth and structure of nanoscale materials, such as nanowires and nanotubes
• electron microscopy of the self-assembly of nanostructures on surfaces or in thin films
• the in-situ manipulation and characterization of nanomaterials and processes by electron and ion beam techniques
• electron microscopy of functional nanocomposite materials
• electron microscopy of organic-inorganic interfaces for molecular and electronic applications
Important topics will be highlighted in keynote presentations given by leading invited experts and will be targeted to a non-expert audience, designed to communicate the potential of quantitative EM to application-oriented researchers in all of the fields addressed above. Contributions are solicited that feature applications of quantitative electron microscopy to all different classes of materials.
Hot topics to be covered by the symposium:
The scientific sessions (incl. poster sessions) are grouped into the following clusters covering state-of-the-art characterization / using quantitative electron microscopy (EM) for topic areas of materials science:
• In-situ electron microscopy measurements
• Electron tomography, focused ion beam / scanning electron microscopy techniques (FIB-SEM) and scanning-transmission electron microscopy (STEM)
• Diffractive imaging and diffraction
• Aberration-corrected electron microscopy
• Electron holography
• Electron nanoscopic techniques for local bonding and elemental mapping
• Pump-probe electron microscopy
• Quantitative comparison: experiment vs theory
List of invited speakers:
- Florian Banhart Université de Strasbourg FR
- Juri Barthel ER-C Jülich / RWTH Aachen DE
- Pascale Bayle-Guillemaud CEA-Grenoble, Grenoble FR
- Hugo Bender IMEC Leuven BE
- Jose Calvino Universidad de Cádiz, Cadiz ES
- Aicha Hessler CIME-EPFL, Lausanne CH
- Wayne Kaplan Technion, Haifa IL
- Gerald Kothleitner FELMI Graz AT
- Dierk Raabe Max-Planck-Institut für Eisenforschung Düsseldorf DE
- John Walmsley Norwegian University of Science and Technology, Trondheim, Norway
Scientific Committee:
The symposium organizers agreed to not nominating a scientific committee.
Proceedings:
Accepted contributed papers will be published in
Journal of Materials Science (Springer)
The "instructions to authors" is available at the author's gateway: http://www.editorialmanager.com/jmsc/
Sponsors:
Symposium organizers:
Wolfgang Jaeger
Institute for Materials Science
Christian-Albrechts-University Kiel
DE-24143 Kiel
Germany
Tel: +49 431 880 6177
Fax:+49 431 880 6178
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Rafal Dunin-Borkowski
Center for Electron Nanoscopy
Technical University of Denmark
DK-2800 Kongens Lyngby
Denmark
Tel: +45 4525 6465
Fax:+45 4593 2399
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Paul A. Midgley
Dept. Materials Science and Metallurgy
University of Cambridge
Cambridge CB2 3QZ
UK
Tel: +44 1223 334561
Fax:+44 1223 334567
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Etienne Snoeck
CEMES-CNRS Toulouse
29, rue Jeanne Marvig
F-31055 Toulouse Cedex 4
France
Tel: + 33 5 62 25 78 14
Fax:+ 33 5 62 25 79 99
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